Near-Field Imaging: Revealing Optical Properties of Reduced-Dimensionality Materials at Relevant Length Scales (Adv. Mater. 38/2015)

Near-Field Imaging: Revealing Optical Properties of Reduced-Dimensionality Materials at Relevant Length Scales (Adv. Mater. 38/2015)

Optimizing the optical properties of reduced‐dimensionality materials requires characterization at the relevant length scale, often below the diffraction limit. On page 5693, D. F. Ogletree and co‐workers review the current state of the art for 0D, 1D, and 2D nanomaterials, including novel technique...

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Veröffentlicht in:Advanced materials (Weinheim) 2015-10, Vol.27 (38), p.5692-5692
Hauptverfasser: Ogletree, D. Frank, Schuck, P. James, Weber-Bargioni, Alexander F., Borys, Nicholas J., Aloni, Shaul, Bao, Wei, Barja, Sara, Lee, Jiye, Melli, Mauro, Munechika, Keiko, Whitelam, Stephan, Wickenburg, Sebastian
Format: Artikel
Sprache:eng
Schlagworte:
cathodoluminescence
exciton dynamics
near-field optical microscopy
semiconductor nanowires
transition metal dichalcogenides
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Zusammenfassung:Optimizing the optical properties of reduced‐dimensionality materials requires characterization at the relevant length scale, often below the diffraction limit. On page 5693, D. F. Ogletree and co‐workers review the current state of the art for 0D, 1D, and 2D nanomaterials, including novel techniques like the Molecular Foundry's Campanile probe.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201570255