Chemical imaging by scanning force microscopy

The chemical imaging of surfaces with high lateral resolution i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science. Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power...

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Veröffentlicht in:	Advanced materials (Weinheim) 1995-06, Vol.7 (6), p.549-551
Hauptverfasser:	Akari, Sabri, Horn, Dieter, Keller, Harald, Schrepp, Wolfgang
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Exact sciences and technology Fundamental areas of phenomenology (including applications) Image forming and processing Imaging and optical processing Optics Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Structure of solids and liquids crystallography
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Beschreibung
Zusammenfassung:	The chemical imaging of surfaces with high lateral resolution i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science. Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power of the technique and emphasizes its use for technical surfaces which normally show little contrast in SFM.
ISSN:	0935-9648 1521-4095
DOI:	10.1002/adma.19950070607