A new fault independent test generation algorithm for combinational logic circuits

In order to improve the performance of fault independent test generation algorithms, two strategies are proposed: a critical lines maximization strategy (CLM) and a critical primary inputs flipping strategy (CPF). CLM is used to maximize the number of detected faults while generating a test pattern. CPF is used to derive new test pattern(s) from a generated test pattern with little additional effort. A new fault independent test generation algorithm (MAX) based on these strategies is introduced and illustrated.