Obtaining Thin Film of SnO2/Cu2O and Characterization by X-Ray Diffraction

Thin films of tin and copper oxide forming heterojunction are being studied for applications in photovoltaic systems. The procedure for obtaining such a film was based on the technique of spray pyrolysis with working temperature of 600 ℃. The XRD （X-ray diffraction） showed the formation of tin oxides （SnO2） and copper （Cu2O） and its structural parameters are a, b and c, 4.7534 A^°, 4.7534 A^°, 3.1998 A^° （tetragonal form） and 4.2580 A^°, 4.2580 A^°, 4.2580 A^° （cubic form）, respectively. Highseore Plus program was used for phase identification and DBWSTool2.4 program used for refinement. The grain size was estimated by Williamson-Hall.