A NEW EXX SYSTEM AND ITS APPLICATIONS

IXX (or PIXE-induced XRF) technique gains two main advantages over conventional PIXE method. First, it can be used to avoid or significantly reduce background and spectral interferences from major elements in the sample by proper selecting the primary target. Second, target damage is greatly reduced, so that it is more suitable for the analysis of heatsensitive and delicate specimens. A new IXX system with a very tight geometry is described. Some of its performances and preliminary applications are presented.