Magnetic Field Effect in Scanning Tunneling Microscopy

Magnetic Field Effect in Scanning Tunneling Microscopy

1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microsc...

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Veröffentlicht in:中国科学通报：英文版 1993 (23), p.1941-1943
1. Verfasser: 吴章华 王福熹
Format: Artikel
Sprache:eng
Schlagworte:
effect
magnetic
STM
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Zusammenfassung:1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microscopy (AFM), scanning tunneling potentiometry (STP), scanning near field optical microscopy (SNOM) and ballistic electron emission microscopy (BEEM).
ISSN:2095-9273