APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM

Pure X-ray diffraction profiles have been analysed for polyamide 1010 and PA1010--BMI system by means of multipeak fitting resolution of X-ray diffraction.The methods ofvariance and fourth moment have been applied to determine the particle size and strainvalues for theparacrystalline materials.The results indicated that both variance and fourthmoment of X-ray diffraction line profile yielded approximately the same values of theparticle size and the strain.The particle sizes of(100)reflection have been found todecrease with increasing BMI content,whereas the strain values increased.