Pulsed excimer laser deposition and characterization of ferroelectric lead-zirconate-titanate thin films

The rapid development of ultralarge-scale integration demands integrated devices from ordinary 1-dimensional integrated devices to 3-dimensional devices and multi-function devices. Because of its non-volatility and radiation-hardness, very large (~1000) dielectric constant and polarizability, ferroe...

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Veröffentlicht in:中国科学通报:英文版 1995 (4), p.340-344
1. Verfasser: 陈逸清 郑立荣 张顺开 林成鲁 邹世昌
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Sprache:eng
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Zusammenfassung:The rapid development of ultralarge-scale integration demands integrated devices from ordinary 1-dimensional integrated devices to 3-dimensional devices and multi-function devices. Because of its non-volatility and radiation-hardness, very large (~1000) dielectric constant and polarizability, ferroelectric thin film and its application research have recently attracted great attention in newly functional materials and integrated devices such as
ISSN:2095-9273