Dark output characteristic of γ-ray irradiated CMOS digital image sensors

The quality of dark output images from the CMOS (complementary metal oxide semiconductor) black and white (B&W) digital image sensors captured before and after γ-ray irradiation was studied. The characteristic parameters of the dark output images captured at different radiation dose, e.g. average brightness and its non-uniformity of dark output images, were analyzed by our test software. The primary explanation for the change of the parameters with the radiation dose was given.