Structure, magnetization, and magnetostriction of Sm-R-Fe （R = Pr, Nd） thin films

The structure, magnetization, and magnetostriction of Sm0.9Pr0.1Fex and Sm1-xNdxFel.9 thin films have been investigated using X-ray diffraction, vibrating sample magnetometer, and optical cantilever method. It is found that the structure of Sm0.9Pr0.1Fex thin films consists of an Sm-Pr-Fe amorphous phase when x≤2.69 and that of Sm1-xNdxFel.9 thin films consists of an Sm-Nd-Fe amorphous phase. The in-plane magnetization of Sm0.91Pr0.1Fex thin films increases with increase in the Fe content, and low values of the in-plane coercivity occur in the range of 1.62≤ x≤ 2.28. The magnetostriction value of Sm0.91Pr0.1Fex thin films increases with increasing the Fe content when x ≤ 1.94 and decreases when x 〉 1.94. The in-plane magnetostriction of Sm1-xNdxFe1.9 thin films under low magnetic fields has been improved by the substitution of Nd for Sm when x = 0.2.