Genetic variability and gain for storage root yield and yield components in yam beans
There is limited information on the genetic parameters and genetic gain of yam bean ( Pachyrhizus species) accessions introduced to Rwanda. No comprehensive literature exists on the inheritance of yield and yield components, on segregating populations. This study investigated variability, heritabili...
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Veröffentlicht in: | African crop science journal 2020-02, Vol.28 (1) |
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Sprache: | eng |
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Zusammenfassung: | There is limited information on the genetic parameters and genetic gain
of yam bean ( Pachyrhizus species) accessions introduced to Rwanda.
No comprehensive literature exists on the inheritance of yield and
yield components, on segregating populations. This study investigated
variability, heritability and genetic advance in F2 yam bean genotypes.
Seven F2 yam bean hybrids were evaluated at the Rubona Research Station
located in Southern Province of Rwanda, during growing season 2014B.
Results revealed significant (P 25%) were observed for WOP, PHT, 100SW, TBY, DMC and
STA. Estimates of heritability (H2) were high (greater than 50%) for
all traits, except for seed yield, number of roots and number of pods.
The GA and genetic advance, as percentage of the mean (GAM%), were high
for PV, WOP, PHT, 100SW, TBY and DMC. There were positive and
significant (P |
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ISSN: | 1021-9730 |