Genetic variability and gain for storage root yield and yield components in yam beans

There is limited information on the genetic parameters and genetic gain of yam bean ( Pachyrhizus species) accessions introduced to Rwanda. No comprehensive literature exists on the inheritance of yield and yield components, on segregating populations. This study investigated variability, heritabili...

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Veröffentlicht in:African crop science journal 2020-02, Vol.28 (1)
Hauptverfasser: Ndirigwe, J, Rubaihayo, P, Tukamuhabwa, P, Agaba, R, Tumwegamire, S, Mwanga, R.O.M, Heider, B, Grüneberg, W
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Sprache:eng
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Zusammenfassung:There is limited information on the genetic parameters and genetic gain of yam bean ( Pachyrhizus species) accessions introduced to Rwanda. No comprehensive literature exists on the inheritance of yield and yield components, on segregating populations. This study investigated variability, heritability and genetic advance in F2 yam bean genotypes. Seven F2 yam bean hybrids were evaluated at the Rubona Research Station located in Southern Province of Rwanda, during growing season 2014B. Results revealed significant (P 25%) were observed for WOP, PHT, 100SW, TBY, DMC and STA. Estimates of heritability (H2) were high (greater than 50%) for all traits, except for seed yield, number of roots and number of pods. The GA and genetic advance, as percentage of the mean (GAM%), were high for PV, WOP, PHT, 100SW, TBY and DMC. There were positive and significant (P
ISSN:1021-9730