Test Generation of Crosstalk Delay Faults in VLSI Circuits

Test Generation of Crosstalk Delay Faults in VLSI Circuits

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

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Bibliographische Detailangaben
Hauptverfasser: Jayanthy, S, Bhuvaneswari, M. C
Format: Buch
Sprache:eng
Schlagworte:
Circuits and Systems
Control Structures and Microprogramming
Crosstalk
Engineering
Logic Design
Performance and Reliability
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Beschreibung
Zusammenfassung:The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
DOI:10.1007/978-981-13-2493-2