VLSI Design and Test for Systems Dependability

This work discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	Asai, Shojiro
Format:	Buch
Sprache:	eng
Schlagworte:	Circuits and Systems Electronic Circuits and Devices Engineering Engineering Design Integrated circuits Integrated circuits-Very large scale integration-Design and construction Integrated circuits-Very large scale integration-Testing Quality Control, Reliability, Safety and Risk Systems and Data Security
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	This work discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.
DOI:	10.1007/978-4-431-56594-9