Metrology and standardization for nanotechnology: protocols and industrial innovations

Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

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Bibliographische Detailangaben
Hauptverfasser: Mansfield, Elisabeth, Kaiser, Debra L, Fujita, Daisuke, Van de Voorde, Marcel
Format: Buch
Sprache:eng
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Zusammenfassung:Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.