Ionizing Radiation Effects in Electronics: From Memories to Imagers

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time. Introduction to the Effects of Radiation on Electronic Devices Simone Gerardin and Marta Bagatin Monte Carlo Simulation of Radiation Effects Mélanie Raine A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies Gilles Gasiot and Philippe Roche Radiation Effects in DRAMs Martin Herrmann Radiation Effects in Flash Memories Marta Bagatin and Simone Gerardin Microprocessor Radiation Effects Steven M. Guertin and Lawrence T. Clark Soft-Error Hardened Latch and Flip-Flop Design Lawrence T. Clark Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs Heather M. Quinn, Keith S. Morgan, Paul S. Graham, James B. Krone, Michael P. Caffrey, Kevin Lundgreen, Brian Pratt, David Lee, Gary M. Swift, and Michael J. Wirthlin Single-Event Mitigation Techniques for Analog and Mixed-Signal Circuits T. Daniel Loveless and W. Timothy Holman CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics: TID Effects and Bulk Damage Stud