OODFace: Benchmarking Robustness of Face Recognition under Common Corruptions and Appearance Variations
With the rise of deep learning, facial recognition technology has seen extensive research and rapid development. Although facial recognition is considered a mature technology, we find that existing open-source models and commercial algorithms lack robustness in certain real-world Out-of-Distribution...
Gespeichert in:
Hauptverfasser: | , , , , , , , |
---|---|
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | With the rise of deep learning, facial recognition technology has seen
extensive research and rapid development. Although facial recognition is
considered a mature technology, we find that existing open-source models and
commercial algorithms lack robustness in certain real-world Out-of-Distribution
(OOD) scenarios, raising concerns about the reliability of these systems. In
this paper, we introduce OODFace, which explores the OOD challenges faced by
facial recognition models from two perspectives: common corruptions and
appearance variations. We systematically design 30 OOD scenarios across 9 major
categories tailored for facial recognition. By simulating these challenges on
public datasets, we establish three robustness benchmarks: LFW-C/V, CFP-FP-C/V,
and YTF-C/V. We then conduct extensive experiments on 19 different facial
recognition models and 3 commercial APIs, along with extended experiments on
face masks, Vision-Language Models (VLMs), and defense strategies to assess
their robustness. Based on the results, we draw several key insights,
highlighting the vulnerability of facial recognition systems to OOD data and
suggesting possible solutions. Additionally, we offer a unified toolkit that
includes all corruption and variation types, easily extendable to other
datasets. We hope that our benchmarks and findings can provide guidance for
future improvements in facial recognition model robustness. |
---|---|
DOI: | 10.48550/arxiv.2412.02479 |