Enabling two-dimensional electron gas with high room-temperature electron mobility exceeding 100 cm$^2$/Vs at a perovskite oxide interface
Adv. Mater. 2024, 2409076 In perovskite oxide heterostructures, bulk functional properties coexist with emergent physical phenomena at epitaxial interfaces. Notably, charge transfer at the interface between two insulating oxide layers can lead to the formation of a two-dimensional electron gas (2DEG...
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Zusammenfassung: | Adv. Mater. 2024, 2409076 In perovskite oxide heterostructures, bulk functional properties coexist with
emergent physical phenomena at epitaxial interfaces. Notably, charge transfer
at the interface between two insulating oxide layers can lead to the formation
of a two-dimensional electron gas (2DEG) with possible applications in, e.g.,
high-electronmobility transistors and ferroelectric field-effect transistors.
So far, the realization of oxide 2DEGs is, however, largely limited to the
interface between the single-crystal substrate and epitaxial film, preventing
their deliberate placement inside a larger device architecture. Additionally,
the substrate-limited quality of perovskite oxide interfaces hampers
room-temperature 2DEG performance due to notoriously low electron mobility. In
this work, we demonstrate the controlled creation of an interfacial 2DEG at the
epitaxial interface between perovskite oxides BaSnO$_3$ and LaInO$_3$ with
enhanced room-temperature electron mobilities up to 119 cm$^2$/Vs - the highest
room-temperature value reported so far for a perovskite oxide 2DEG. Using a
combination of state-of-the-art deposition modes during oxide molecular beam
epitaxy, our approach opens up another degree of freedom in optimization and
$in$-$situ$ control of the interface between two epitaxial oxide layers away
from the substrate interface. We thus expect our approach to apply to the
general class of perovskite oxide 2DEG systems and to enable their improved
compatibility with novel device concepts and integration across materials
platforms. |
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DOI: | 10.48550/arxiv.2408.07659 |