Using Formal Verification to Evaluate Single Event Upsets in a RISC-V Core

Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can reverse a bit in a sequential element, resulting in a system...

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Hauptverfasser:	Xue, Bing, Zwolinski, Mark
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer Science - Hardware Architecture
Online-Zugang:	Volltext bestellen
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