Physics-Informed Machine Learning for Battery Degradation Diagnostics: A Comparison of State-of-the-Art Methods
Monitoring the health of lithium-ion batteries' internal components as they age is crucial for optimizing cell design and usage control strategies. However, quantifying component-level degradation typically involves aging many cells and destructively analyzing them throughout the aging test, li...
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Veröffentlicht in: | arXiv.org 2024-04 |
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Sprache: | eng |
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Zusammenfassung: | Monitoring the health of lithium-ion batteries' internal components as they age is crucial for optimizing cell design and usage control strategies. However, quantifying component-level degradation typically involves aging many cells and destructively analyzing them throughout the aging test, limiting the scope of quantifiable degradation to the test conditions and duration. Fortunately, recent advances in physics-informed machine learning (PIML) for modeling and predicting the battery state of health demonstrate the feasibility of building models to predict the long-term degradation of a lithium-ion battery cell's major components using only short-term aging test data by leveraging physics. In this paper, we present four approaches for building physics-informed machine learning models and comprehensively compare them, considering accuracy, complexity, ease-of-implementation, and their ability to extrapolate to untested conditions. We delve into the details of each physics-informed machine learning method, providing insights specific to implementing them on small battery aging datasets. Our study utilizes long-term cycle aging data from 24 implantable-grade lithium-ion cells subjected to varying temperatures and C-rates over four years. This paper aims to facilitate the selection of an appropriate physics-informed machine learning method for predicting long-term degradation in lithium-ion batteries, using short-term aging data while also providing insights about when to choose which method for general predictive purposes. |
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ISSN: | 2331-8422 |
DOI: | 10.48550/arxiv.2404.04429 |