Design of SCALES: A 2-5 Micron Coronagraphic Integral Field Spectrograph for Keck Observatory

We present the design of SCALES (Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy) a new 2-5 micron coronagraphic integral field spectrograph under construction for Keck Observatory. SCALES enables low-resolution (R~50) spectroscopy, as well as medium-resolution (R~4,000) spectrosco...

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Hauptverfasser: Skemer, Andrew, Stelter, R. Deno, Sallum, Stephanie, MacDonald, Nicholas, Kupke, Renate, Ratliffe, Christopher, Banyal, Ravinder, Hasan, Amirul, Varshney, Hari Mohan, Surya, Arun, Prakash, Ajin, Thirupathi, Sivarani, Sethuraman, Ramya, V, Govinda K, Fitzgerald, Michael P, Wang, Eric, Kassis, Marc, Absil, Olivier, Alvarez, Carlos, Batalha, Natasha, Boucher, Marc-Andre, Bourgenot, Cyril, Brandt, Timothy, Briesemeister, Zackery, de Kleer, Katherine, de Pater, Imke, Deich, William, Divakar, Devika, Filion, Guillaume, Gauvin, Etienne, Gonzales, Michael, Greene, Thomas, Hinz, Philip, Jensen-Clem, Rebecca, Johnson, Christopher, Kain, Isabel, Kruglikov, Gabriel, Lach, Mackenzie, Landry, Jean-Thomas, Li, Jialin, Liu, Michael C, Lyke, James, Magnone, Kenneth, Marin, Eduardo, Martin, Emily C, Martinez, Raquel A, Mawet, Dimitri, Miles, Brittany, Sandford, Dale, Sheehan, Patrick, Sohn, Ji Man, Stone, Jordan
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Sprache:eng
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Zusammenfassung:We present the design of SCALES (Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy) a new 2-5 micron coronagraphic integral field spectrograph under construction for Keck Observatory. SCALES enables low-resolution (R~50) spectroscopy, as well as medium-resolution (R~4,000) spectroscopy with the goal of discovering and characterizing cold exoplanets that are brightest in the thermal infrared. Additionally, SCALES has a 12x12" field-of-view imager that will be used for general adaptive optics science at Keck. We present SCALES's specifications, its science case, its overall design, and simulations of its expected performance. Additionally, we present progress on procuring, fabricating and testing long lead-time components.
DOI:10.48550/arxiv.2208.10721