Dielectric Modeling of Oil-paper Insulation Systems at High DC Voltage Stress Using a Charge-carrier-based Approach

It is state-of-the-art to describe the dielectric behavior of an insulation material by its permittivity and its specific electric conductivity in order to estimate the dielectric stress of an insulation system. Thus, the electric field at DC voltage stress is determined according to the stationary...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:arXiv.org 2019-11
Hauptverfasser: Gabler, Tobias, Backhaus, Karsten, Großmann, Steffen, Fritsche, Ronny
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:It is state-of-the-art to describe the dielectric behavior of an insulation material by its permittivity and its specific electric conductivity in order to estimate the dielectric stress of an insulation system. Thus, the electric field at DC voltage stress is determined according to the stationary electrical conduction field with the electric conductivity of the insulation materials. However, at oil-insulated arrangements a higher field strength in front of bare metal electrodes at high DC voltage stress occurs, which is not explainable with this model. Therefore, a charge carrier-based approach is presented to describe the dielectric behavior of the oil-paper insulation. It describes the movement of charge carriers and their effect on the electric field strength. Their drift leads to an accumulation of charge carriers in front of electrodes which results in a higher field strength in these areas, which can be calculated numerically using the Poisson-Nernst-Planck equation system. Compared to the conductivity-based model fundamental differences can be shown. Breakdown experiments qualitatively confirm the expectations according to the charge carrier-based approach. The results show that the charge carrier-based field distribution has to be considered for modelling the electrical field strength distribution at high DC voltage stress. They also show, that the dielectric behavior of these arrangements cannot be explained according to the state-of-the-art model.
ISSN:2331-8422
DOI:10.48550/arxiv.1911.09493