Time- and momentum-resolved photoemission studies using time-of-flight momentum microscopy at a free-electron laser
Time-resolved photoemission with ultrafast pump and probe pulses is an emerging technique with wide application potential. Real-time recording of non-equilibrium electronic processes, transient states in chemical reactions or the interplay of electronic and structural dynamics offers fascinating opp...
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Veröffentlicht in: | arXiv.org 2019-09 |
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Hauptverfasser: | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
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Sprache: | eng |
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Zusammenfassung: | Time-resolved photoemission with ultrafast pump and probe pulses is an emerging technique with wide application potential. Real-time recording of non-equilibrium electronic processes, transient states in chemical reactions or the interplay of electronic and structural dynamics offers fascinating opportunities for future research. Combining valence-band and core-level spectroscopy with photoelectron diffraction for electronic, chemical and structural analysis requires few 10 fs soft X-ray pulses with some 10 meV spectral resolution, which are currently available at high repetition rate free-electron lasers. The PG2 beamline at FLASH (DESY, Hamburg) provides a high pulse rate of 5000 pulses/s, 60 fs pulse duration and 40 meV bandwidth in an energy range of 25-830 eV with a photon beam size down to 50 microns in diameter. We have constructed and optimized a versatile setup commissioned at FLASH/PG2 that combines FEL capabilities together with a multidimensional recording scheme for photoemission studies. We use a full-field imaging momentum microscope with time-of-flight energy recording as the detector for mapping of 3D band structures in (\(k_x\), \(k_y\), \(E\)) parameter space with unprecedented efficiency. Our instrument can image full surface Brillouin zones with up to 7 Å \(^{-1}\) diameter in a binding-energy range of several eV, resolving about \(2.5\times10^5\) data voxels. As an example, we present results for the ultrafast excited state dynamics in the model van der Waals semiconductor WSe\(_2\). |
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ISSN: | 2331-8422 |
DOI: | 10.48550/arxiv.1906.12155 |