Characterization of Electro-Optical Devices with Low Jitter Single Photon Detectors -- Towards an Optical Sampling Oscilloscope Beyond 100 GHz

Characterization of Electro-Optical Devices with Low Jitter Single Photon Detectors -- Towards an Optical Sampling Oscilloscope Beyond 100 GHz

We showcase an optical random sampling scope that exploits single photon counting and apply it to characterize optical transceivers. We study single photon detectors with a jitter down to 40 ps. The method can be extended beyond 100 GHz.

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Hauptverfasser: Fedder, Helmut, Oesterwind, Steffen, Wick, Markus, Shavrin, Igor, Schlagmüller, Michael, Olbrich, Fabian, Michler, Peter, Veigel, Thomas, Berroth, Manfred, Walter, Nicolai, Hartmann, Wladick, Pernice, Wolfram, Kovalyuk, Vadim
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Physics - Instrumentation and Detectors
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creator Fedder, Helmut
Oesterwind, Steffen
Wick, Markus
Shavrin, Igor
Schlagmüller, Michael
Olbrich, Fabian
Michler, Peter
Veigel, Thomas
Berroth, Manfred
Walter, Nicolai
Hartmann, Wladick
Pernice, Wolfram
Kovalyuk, Vadim
description We showcase an optical random sampling scope that exploits single photon counting and apply it to characterize optical transceivers. We study single photon detectors with a jitter down to 40 ps. The method can be extended beyond 100 GHz.
doi_str_mv 10.48550/arxiv.1810.05744
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title Characterization of Electro-Optical Devices with Low Jitter Single Photon Detectors -- Towards an Optical Sampling Oscilloscope Beyond 100 GHz
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