Characterization of Electro-Optical Devices with Low Jitter Single Photon Detectors -- Towards an Optical Sampling Oscilloscope Beyond 100 GHz

Characterization of Electro-Optical Devices with Low Jitter Single Photon Detectors -- Towards an Optical Sampling Oscilloscope Beyond 100 GHz

We showcase an optical random sampling scope that exploits single photon counting and apply it to characterize optical transceivers. We study single photon detectors with a jitter down to 40 ps. The method can be extended beyond 100 GHz.

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Bibliographische Detailangaben
Hauptverfasser: Fedder, Helmut, Oesterwind, Steffen, Wick, Markus, Shavrin, Igor, Schlagmüller, Michael, Olbrich, Fabian, Michler, Peter, Veigel, Thomas, Berroth, Manfred, Walter, Nicolai, Hartmann, Wladick, Pernice, Wolfram, Kovalyuk, Vadim
Format: Artikel
Sprache:eng
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Physics - Instrumentation and Detectors
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Zusammenfassung:We showcase an optical random sampling scope that exploits single photon counting and apply it to characterize optical transceivers. We study single photon detectors with a jitter down to 40 ps. The method can be extended beyond 100 GHz.
DOI:10.48550/arxiv.1810.05744