Standard Cell Library Evaluation with Multiple lithography-compliant verification and Improved Synopsys Pin Access Checking Utility

While standard cell layouts are drawn with minimum design rules to maximize the benefit of design area shrinkage, the complicated design rules have caused difficulties with signal routes accessing the pins in standard cell layouts. As a result, it has become a great challenge for physical layout des...

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Hauptverfasser:	Li, Yongfu, Ang, Wan Chia, Lee, Chin Hui, Chua, Kok Peng, Ong, Yoong Seang Jonathan, Hui, Chiu Wing Colin
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer Science - Other Computer Science
Online-Zugang:	Volltext bestellen
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