2D-3D crossover in a dense electron liquid in silicon

Doping of silicon via phosphene exposures alternating with molecular beam epitaxy overgrowth is a path to Si:P substrates for conventional microelectronics and quantum information technologies. The technique also provides a new and well-controlled material for systematic studies of two-dimensional l...

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Veröffentlicht in:arXiv.org 2018-02
Hauptverfasser: Matmon, Guy, Ginossar, Eran, Villis, Byron J, Alex Kölker, Lim, Tingbin, Solanki, Hari, Schofield, Steven R, Curson, Neil J, Li, Juerong, Murdin, Ben N, Fisher, Andrew J, Aeppli, Gabriel
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Sprache:eng
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Zusammenfassung:Doping of silicon via phosphene exposures alternating with molecular beam epitaxy overgrowth is a path to Si:P substrates for conventional microelectronics and quantum information technologies. The technique also provides a new and well-controlled material for systematic studies of two-dimensional lattices with a half-filled band. We show here that for a dense (\(n_s=2.8\times 10^{14}\)\,cm\(^{-2}\)) disordered two-dimensional array of P atoms, the full field angle-dependent magnetostransport is remarkably well described by classic weak localization theory with no corrections due to interaction effects. The two- to three-dimensional cross-over seen upon warming can also be interpreted using scaling concepts, developed for anistropic three-dimensional materials, which work remarkably except when the applied fields are nearly parallel to the conducting planes.
ISSN:2331-8422
DOI:10.48550/arxiv.1802.05208