Metal-poor dwarf galaxies in the SIGRID galaxy sample. II. The electron temperature-abundance calibration and the parameters that affect it
In this paper, we use the Mappings photoionization code to explore the physical parameters that impact on the measurement of electron temperature and abundance in HII regions. In the previous paper we presented observations and measurements of physical properties from the spectra of seventeen HII re...
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Veröffentlicht in: | arXiv.org 2014-05 |
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Sprache: | eng |
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Zusammenfassung: | In this paper, we use the Mappings photoionization code to explore the physical parameters that impact on the measurement of electron temperature and abundance in HII regions. In the previous paper we presented observations and measurements of physical properties from the spectra of seventeen HII regions in fourteen isolated dwarf irregular galaxies from the SIGRID sample. Here, we analyze these observations further, together with three additional published data sets. We explore the effects of optical thickness, electron density, ionization parameter, ionization source, and non-equilibrium effects on the relation between electron temperature and metallicity. We present a standard model that fits the observed data remarkably well at metallicities between 1/10 and 1 solar. We investigate the effects of optically thin HII regions, and show that they can have a considerable effect on the measured electron temperature, and that there is evidence that some of the observed objects are optically thin. We look at the role of the ionization parameter and find that lower ionization parameter values give better fits at higher oxygen abundance. We show that higher pressures combined with low optical depth, and also kappa electron energy distributions at low kappa values, can generate the apparent high electron temperatures in low metallicity HII regions, and that the former provides the better fit to observations. We examine the effects of these parameters on the strong line diagnostic methods. We extend this to three-dimensional diagnostic grids to confirm how well the observations are described by the grids. |
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ISSN: | 2331-8422 |
DOI: | 10.48550/arxiv.1405.7170 |