Imaging ellipsometry of graphene

Imaging ellipsometry of graphene

Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical co...

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Veröffentlicht in:arXiv.org 2010-08
Hauptverfasser: Wurstbauer, Ulrich, Röling, Christian, Wurstbauer, Ursula, Wegscheider, Werner, Vaupel, Matthias, Thiesen, Peter H, Weiss, Dieter
Format: Artikel
Sprache:eng
Schlagworte:
Graphene
Imaging
Optical properties
Physics - Materials Science
Silicon dioxide
Spectroellipsometry
Substrates
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Zusammenfassung:Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way the influence of the substrate on graphene's optical properties can be investigated
ISSN:2331-8422
DOI:10.48550/arxiv.1008.3206