Lifetime measurements (T1) of electron spins in Si/SiGe quantum dots

We have observed the Zeeman-split excited state of a spin-1/2 multi-electron Si/SiGe depletion quantum dot and measured its spin relaxation time T1 in magnetic fields up to 2 T. Using a new step-and-reach technique, we have experimentally verified the g-value of 2.0 +/- 0.1 for the observed Zeeman d...

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Hauptverfasser: Hayes, Robert R, Kiselev, Andrey A, Borselli, Matthew G, Bui, Steven S, CrokeIII, Edward T, Deelman, Peter W, Maune, Brett M, Milosavljevic, Ivan, Moon, Jeong-Sun, Ross, Richard S, Schmitz, Adele E, Gyure, Mark F, Hunter, Andrew T
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Sprache:eng
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Zusammenfassung:We have observed the Zeeman-split excited state of a spin-1/2 multi-electron Si/SiGe depletion quantum dot and measured its spin relaxation time T1 in magnetic fields up to 2 T. Using a new step-and-reach technique, we have experimentally verified the g-value of 2.0 +/- 0.1 for the observed Zeeman doublet. We have also measured T1 of single- and multi-electron spins in InGaAs quantum dots. The lifetimes of the Si/SiGe system are appreciably longer than those for InGaAs dots for comparable magnetic field strengths, but both approach one second at sufficiently low fields (< 1 T for Si, and < 0.2 T for InGaAs).
DOI:10.48550/arxiv.0908.0173