Effects of Interfacial Oxidative Layer Removal on Charge Carrier Recombination Dynamics in InP/ZnSe x S1–x Core/Shell Quantum Dots

Red-light-emitting InP/ZnSe x S1–x core/shell quantum dots (QDs) were prepared by one-pot synthesis with optimal hydrogen fluoride (HF) treatment. Most of the surficial oxidative species could be removed, and the dangling bonds would be passivated by Zn ions for the InP cores during HF treatment, wh...

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Veröffentlicht in:The journal of physical chemistry letters 2021-08, Vol.12 (30), p.7194-7200
Hauptverfasser: Pu, Ying-Chih, Fan, Hsiao-Chuan, Chang, Jui-Cheng, Chen, Yu-Hung, Tseng, Shih-Wen
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Sprache:eng
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Zusammenfassung:Red-light-emitting InP/ZnSe x S1–x core/shell quantum dots (QDs) were prepared by one-pot synthesis with optimal hydrogen fluoride (HF) treatment. Most of the surficial oxidative species could be removed, and the dangling bonds would be passivated by Zn ions for the InP cores during HF treatment, which would be beneficial to the subsequent ZnSe x S1–x shell coating. Three-dimensional time-resolved photoluminescence spectra of the QD samples were analyzed by singular value decomposition global fitting to determine the radiative and nonradiative lifetimes of charge carriers. A proposed model illustrated that the charge carriers in the InP/ZnSe x S1–x QDs with interfacial oxidative layer removal would evidently recombine through radiative pathways, mainly from the conduction band to the valence band (lifetime, 33 ns) and partially from the trap states (lifetime, 150 ns). This work offers the important physical insight into the charge carrier dynamics of low-toxicity QDs which have the desired optical properties for optoelectronic applications.
ISSN:1948-7185
1948-7185
DOI:10.1021/acs.jpclett.1c02125