A 40 nm 0.32 V 3.5 MHz 11T single-ended bit-interleaving subthreshold SRAM with data-aware write-assist

This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40G...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Chiu, Yi-Wei, Hu, Yu-Hao, Tu, Ming-Hsien, Zhao, Jun-Kai, Jou, Shyh-Jye, Chuang, Ching-Te
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for VDD down to 0.32 V (~0.69X of threshold voltage) with VDDMIN limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 μW (27.2 μW) at 25 °C.
DOI:10.5555/2648668.2648683