Test circuits for substrate noise evaluation in CMOS digital ICs

Test circuits for substrate noise evaluation in CMOS digital ICs

A Transition Controllable Noise Source (TCNS) generates substrate noises with controlled transitions in size, interstage delay, and direction. The noises are measured in a 100-ps 100-uV resolution by a linear substrate voltage detector that uses a front-end PMOS source follower probing substrate pot...

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Bibliographische Detailangaben
Hauptverfasser: Nagata, Makoto, Ohmoto, Takafumi, Nagai, Jin, Morie, Takashi, Iwata, Atsushi
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Applied computing > Physical sciences and engineering > Electronics
Computer systems organization > Dependable and fault-tolerant systems and networks
General and reference > Cross-computing tools and techniques > Performance
Hardware > Communication hardware, interfaces and storage > Signal processing systems
Hardware > Integrated circuits > Semiconductor memory
Hardware > Robustness
Networks > Network performance evaluation
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Zusammenfassung:A Transition Controllable Noise Source (TCNS) generates substrate noises with controlled transitions in size, interstage delay, and direction. The noises are measured in a 100-ps 100-uV resolution by a linear substrate voltage detector that uses a front-end PMOS source follower probing substrate potential and a back-end latch comparator for sampling/digitizing the source follower output. A 0.4-um CMOS test chip demonstrates the effectiveness of these circuits in performing advanced researches on the substrate noise.
DOI:10.1145/370155.370209