Incremental event-driven simulation of digital FET circuits
This paper presents a new and efficient approach to transistor-level simulation of very large, digital, FET circuits. By the simple expedient of letting only one device current change at any given time, simulation can be performed in an event-driven manner. Circuit equations are incrementally re-sol...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 741 |
---|---|
container_issue | |
container_start_page | 737 |
container_title | |
container_volume | |
creator | Visweswariah, Chandramouli Wehbeh, Jalal A. |
description | This paper presents a new and efficient approach to transistor-level simulation of very large, digital, FET circuits. By the simple expedient of letting only one device current change at any given time, simulation can be performed in an event-driven manner. Circuit equations are incrementally re-solved after each local perturbation. A prototype implementation of the new formulation and experimental results are presented. |
doi_str_mv | 10.1145/157485.165111 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>proquest_6IE</sourceid><recordid>TN_cdi_acm_books_10_1145_157485_165111_brief</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1600317</ieee_id><sourcerecordid>31352448</sourcerecordid><originalsourceid>FETCH-LOGICAL-a272t-9f6e5249d20dbfe2204c87007639972e7b89f63a73570a9c05be03c7b779c1853</originalsourceid><addsrcrecordid>eNqNkM1LxDAQxQMquKx79OSlJ092nWmaJsGTLH4sLHhR8BbSdCrRfqxNK_jfm6WCV-fyYN6Px-Mxdo6wRszFNQqZK7HGQiDiEVtpqUBpqeNf6mO2AMlVigCvp2wVwjvEywVyrRfsZtu5gVrqRtsk9BU1rQYfNQm-nRo7-r5L-jqp_Js_IPd3z4nzg5v8GM7YSW2bQKtfXbKXaG8e093Tw3Zzu0ttJrMx1XVBIst1lUFV1pRlkDslAWQRG8iMZKkiwq3kQoLVDkRJwJ0sY3mHSvAlu5xz90P_OVEYTeuDo6axHfVTMBx5zM9VBC9m0BOR2Q--tcO3wQKAo_yLsa41Zd9_BINgDgOaeUAzDxjBq3-Bphw81fwHJM1rrQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>31352448</pqid></control><display><type>conference_proceeding</type><title>Incremental event-driven simulation of digital FET circuits</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Visweswariah, Chandramouli ; Wehbeh, Jalal A.</creator><creatorcontrib>Visweswariah, Chandramouli ; Wehbeh, Jalal A.</creatorcontrib><description>This paper presents a new and efficient approach to transistor-level simulation of very large, digital, FET circuits. By the simple expedient of letting only one device current change at any given time, simulation can be performed in an event-driven manner. Circuit equations are incrementally re-solved after each local perturbation. A prototype implementation of the new formulation and experimental results are presented.</description><identifier>ISSN: 0738-100X</identifier><identifier>ISBN: 9780897915779</identifier><identifier>ISBN: 0897915771</identifier><identifier>DOI: 10.1145/157485.165111</identifier><language>eng</language><publisher>New York, NY, USA: ACM</publisher><subject>Circuit simulation ; Computational modeling ; Computing methodologies -- Modeling and simulation -- Simulation types and techniques -- Discrete-event simulation ; Discrete event simulation ; Equations ; FET circuits ; Hardware -- Hardware validation -- Functional verification -- Simulation and emulation ; Hardware -- Integrated circuits ; Hardware -- Very large scale integration design ; Piecewise linear approximation ; Piecewise linear techniques ; Switches ; Virtual prototyping ; Voltage</subject><ispartof>30th ACM/IEEE Design Automation Conference, 1993, p.737-741</ispartof><rights>1993 ACM</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1600317$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,792,2052,4036,4037,27902,54733,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1600317$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Visweswariah, Chandramouli</creatorcontrib><creatorcontrib>Wehbeh, Jalal A.</creatorcontrib><title>Incremental event-driven simulation of digital FET circuits</title><title>30th ACM/IEEE Design Automation Conference</title><addtitle>DAC</addtitle><description>This paper presents a new and efficient approach to transistor-level simulation of very large, digital, FET circuits. By the simple expedient of letting only one device current change at any given time, simulation can be performed in an event-driven manner. Circuit equations are incrementally re-solved after each local perturbation. A prototype implementation of the new formulation and experimental results are presented.</description><subject>Circuit simulation</subject><subject>Computational modeling</subject><subject>Computing methodologies -- Modeling and simulation -- Simulation types and techniques -- Discrete-event simulation</subject><subject>Discrete event simulation</subject><subject>Equations</subject><subject>FET circuits</subject><subject>Hardware -- Hardware validation -- Functional verification -- Simulation and emulation</subject><subject>Hardware -- Integrated circuits</subject><subject>Hardware -- Very large scale integration design</subject><subject>Piecewise linear approximation</subject><subject>Piecewise linear techniques</subject><subject>Switches</subject><subject>Virtual prototyping</subject><subject>Voltage</subject><issn>0738-100X</issn><isbn>9780897915779</isbn><isbn>0897915771</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNqNkM1LxDAQxQMquKx79OSlJ092nWmaJsGTLH4sLHhR8BbSdCrRfqxNK_jfm6WCV-fyYN6Px-Mxdo6wRszFNQqZK7HGQiDiEVtpqUBpqeNf6mO2AMlVigCvp2wVwjvEywVyrRfsZtu5gVrqRtsk9BU1rQYfNQm-nRo7-r5L-jqp_Js_IPd3z4nzg5v8GM7YSW2bQKtfXbKXaG8e093Tw3Zzu0ttJrMx1XVBIst1lUFV1pRlkDslAWQRG8iMZKkiwq3kQoLVDkRJwJ0sY3mHSvAlu5xz90P_OVEYTeuDo6axHfVTMBx5zM9VBC9m0BOR2Q--tcO3wQKAo_yLsa41Zd9_BINgDgOaeUAzDxjBq3-Bphw81fwHJM1rrQ</recordid><startdate>19930701</startdate><enddate>19930701</enddate><creator>Visweswariah, Chandramouli</creator><creator>Wehbeh, Jalal A.</creator><general>ACM</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>19930701</creationdate><title>Incremental event-driven simulation of digital FET circuits</title><author>Visweswariah, Chandramouli ; Wehbeh, Jalal A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a272t-9f6e5249d20dbfe2204c87007639972e7b89f63a73570a9c05be03c7b779c1853</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Circuit simulation</topic><topic>Computational modeling</topic><topic>Computing methodologies -- Modeling and simulation -- Simulation types and techniques -- Discrete-event simulation</topic><topic>Discrete event simulation</topic><topic>Equations</topic><topic>FET circuits</topic><topic>Hardware -- Hardware validation -- Functional verification -- Simulation and emulation</topic><topic>Hardware -- Integrated circuits</topic><topic>Hardware -- Very large scale integration design</topic><topic>Piecewise linear approximation</topic><topic>Piecewise linear techniques</topic><topic>Switches</topic><topic>Virtual prototyping</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Visweswariah, Chandramouli</creatorcontrib><creatorcontrib>Wehbeh, Jalal A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Visweswariah, Chandramouli</au><au>Wehbeh, Jalal A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Incremental event-driven simulation of digital FET circuits</atitle><btitle>30th ACM/IEEE Design Automation Conference</btitle><stitle>DAC</stitle><date>1993-07-01</date><risdate>1993</risdate><spage>737</spage><epage>741</epage><pages>737-741</pages><issn>0738-100X</issn><isbn>9780897915779</isbn><isbn>0897915771</isbn><abstract>This paper presents a new and efficient approach to transistor-level simulation of very large, digital, FET circuits. By the simple expedient of letting only one device current change at any given time, simulation can be performed in an event-driven manner. Circuit equations are incrementally re-solved after each local perturbation. A prototype implementation of the new formulation and experimental results are presented.</abstract><cop>New York, NY, USA</cop><pub>ACM</pub><doi>10.1145/157485.165111</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0738-100X |
ispartof | 30th ACM/IEEE Design Automation Conference, 1993, p.737-741 |
issn | 0738-100X |
language | eng |
recordid | cdi_acm_books_10_1145_157485_165111_brief |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit simulation Computational modeling Computing methodologies -- Modeling and simulation -- Simulation types and techniques -- Discrete-event simulation Discrete event simulation Equations FET circuits Hardware -- Hardware validation -- Functional verification -- Simulation and emulation Hardware -- Integrated circuits Hardware -- Very large scale integration design Piecewise linear approximation Piecewise linear techniques Switches Virtual prototyping Voltage |
title | Incremental event-driven simulation of digital FET circuits |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T01%3A32%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Incremental%20event-driven%20simulation%20of%20digital%20FET%20circuits&rft.btitle=30th%20ACM/IEEE%20Design%20Automation%20Conference&rft.au=Visweswariah,%20Chandramouli&rft.date=1993-07-01&rft.spage=737&rft.epage=741&rft.pages=737-741&rft.issn=0738-100X&rft.isbn=9780897915779&rft.isbn_list=0897915771&rft_id=info:doi/10.1145/157485.165111&rft_dat=%3Cproquest_6IE%3E31352448%3C/proquest_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=31352448&rft_id=info:pmid/&rft_ieee_id=1600317&rfr_iscdi=true |