On per-test fault diagnosis using the X-fault model

This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for anal...

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Hauptverfasser:	Wen, Xiaoqing, Miyoshi, Tokiharu, Kajihara, Seiji, Wang, Laung-Terng, Saluja, K. K., Kinoshita, K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analytical models Applied sciences Circuit faults Circuit simulation Computer aided design Computer science control theory systems Computer systems organization Computer systems organization > Dependable and fault-tolerant systems and networks Data mining Electronics Exact sciences and technology Failure analysis Fault diagnosis Hardware > Hardware test Hardware > Robustness Informatics Information analysis Integrated circuits Integrated circuits by function (including memories and processors) Logic Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Software Threshold voltage
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Beschreibung
Zusammenfassung:	This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for analyzing the relation between observed and simulated responses to extract diagnostic information and to score the results of diagnosis. Experimental results show the effectiveness of our method.
ISSN:	1092-3152 1558-2434
DOI:	10.1109/ICCAD.2004.1382653