Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach

Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach

This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a t...

Ausführliche Beschreibung

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Hauptverfasser: Kheriji, R., Danelon, V., Carbonero, J. L., Mir, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit faults
Circuit testing
Costs
Current measurement
Engineering Sciences
Hardware > Emerging technologies
Hardware > Hardware test
Hardware > Hardware validation > Functional verification > Simulation and emulation
Hardware > Robustness
Hardware > Very large scale integration design
Low-noise amplifiers
Micro and nanotechnologies
Microelectronics
Noise measurement
Production
Radio frequency
Resistors
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Beschreibung
Zusammenfassung:This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.
ISSN:1530-1591
1558-1101
DOI:10.1109/DATE.2005.233