Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

DE-634
DE-1043
DE-Aug4
DE-573
DE-92
DE-859
DE-863
DE-862
Volltext

Statistical performance analysis and modeling techniques for nanometer VLSI designs von Shen, Ruijing, Tan, Sheldon X. D.

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Klappentext

Catalogue of Chinese manuscripts and rare books the Royal Library Copenhagen, Denmark von Pedersen, Bent Lerbæk

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