Electrical overstress (EOS) devices, circuits and systems von Voldman, Steven H.

ESD failure mechanisms and models von Voldman, Steven H.

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Data mining and diagnosing IC fails von Huisman, Leendert M.

Inhaltstext

Theory of CMOS digital circuits and circuit failures von Shoji, Masakazu

ESD failure mechanisms and models von Voldman, Steven H.

Failure mechanisms in semiconductor devices von Amerasekera, E. A., Campbell, D. S.

Semiconductor device and failure analysis using photon emission microscopy von Chim, Wai-Kin

Wire bonding in microelectronics materials, processes, reliability, and yield von Harman, George G.

Reliability and degradation of III - V optical devices von Ueda, Osamu

Electromigration and electronic device degradation

Electrical overstress (EOS) devices, circuits and systems von Voldman, Steven H.

The role of microscopy in semiconductor failure analysis von Richards, B. P., Footner, P. K.

ESD failure mechanisms and models von Voldman, Steven H.

Failure analysis of integrated circuits tools and techniques

Failure modes and mechanisms in electronic packages von Viswanadham, Puligandla, Singh, Pratap

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Integrated circuit failure analysis a guide to preparation techniques von Beck, Friedrich

Reliability and yield problems of wire bonding in microelectronics the application of materials and interface science von Harman, George G.