Integration of design, implementation and application in measurement, automation and control

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Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014)...

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Advanced mathematical and computational tools in metrology and testing IX

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Advanced mathematical & computational tools in metrology & testing VIII

Proceedings of the 9th International Symposium on Measurement and Quality Control [9th ISMQC] ; November 21 - 24, 2007 ; Chennai, India ; in association with International Measurem...

Advanced mathematical & computational tools in metrology VII

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Sensors, measurement, intelligent materials and technologies III selected, peer reviewed papers from the 2014 3rd International Conference on Sensors, Measurement and Intelligent M...

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Smart diagnostics V selected, peer reviewed papers from the 5th International Congress of Technical Diagnostics, September 3-5, 2012, Krakow, Poland

Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA

Frequency standards and metrology proceedings of the 6th Symposium on Frequency Standards and Metrology : University of St Andrews, Fife, Scotland, 9-14 September 2001

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Advanced mathematical & computational tools in metrology V

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Proceedings of the John Hall Symposium in honor of John Hall on the occasion of his 70th birthday : University of Colorado, Boulder, CO, USA, 13-15 August 2004

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Proceedings of the Fifth Symposium on Frequency Standards and Metrology Woods Hole, Massachusetts, 15 - 19 October 1995

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Advanced mathematical & computational tools in metrology VI

Advanced mathematical & computational tools in metrology VI

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Advanced mathematical & computational tools in metrology VI

Advanced mathematical & computational tools in metrology V

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Machine vision applications in industrial inspection VIII 24 - 26 January 2000, San Jose, California

Advanced mathematical & computational tools in metrology IV

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Three-dimensional image capture and applications III 24 - 25 January 2000, San Jose, California

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