ESD failure mechanisms and models von Voldman, Steven H.

DE-1046
DE-1047
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ESD failure mechanisms and models von Voldman, Steven H.

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DE-473
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An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces von Moreira, José

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Wafer-level testing and test during burn-in for integrated circuits von Bahukudumbi, Sudarshan

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Electronics reliability and measurement technology nondestructive evaluation

Volltext

Principles of semiconductor network testing von Afshar, Amir

DE-1046
DE-1047
Volltext

Principles of semiconductor network testing von Afshar, Amir

Electronics reliability and measurement technology nondestructive evaluation

DE-860
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High quality test pattern generation and boolean satisfiability von Eggersglüß, Stephan

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ESD failure mechanisms and models = Electrostatic discharge von Voldman, Steven H.

Digital design for testability and concurrent fault detection in LSI and VLSI devices von Mercer, Melvin Ray

A test generation and test set evaluation system for sequential logic networks von Read, William Russell

Compatibility and testing of electronic components von Jowett, C. E., (Charles Eric)

DE-1046
Volltext