Robust design of microelectronics assemblies against mechanical shock, temperature and moisture
This book discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. De...
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Format: | E-Book |
Sprache: | English |
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Cambridge, UK
Woodhead Publishing
[2015]
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Schriftenreihe: | Woodhead Publishing series in electronic and optical materials
number 81 |
Online-Zugang: | Volltext |
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LEADER | 00000cam a2200000 i 4500 | ||
---|---|---|---|
001 | ZDB-10-ESC-ocn910159095 | ||
003 | OCoLC | ||
005 | 20241208213018.0 | ||
006 | m o d | ||
007 | cr cnu|||unuuu | ||
008 | 150527s2015 enk ob 001 0 eng d | ||
015 | |a GBB552921 |2 bnb | ||
016 | 7 | |a 017166313 |2 Uk | |
020 | |a 0857099116 | ||
020 | |a 1845695283 | ||
020 | |a 9780857099112 | ||
020 | |a 9781845695286 | ||
020 | |z 9781845695286 | ||
100 | 1 | |a Wong, E. -H. | |
245 | 1 | 0 | |a Robust design of microelectronics assemblies against mechanical shock, temperature and moisture |c E.-H. Wong and Y.-W. Mai |
264 | 1 | |a Cambridge, UK |b Woodhead Publishing |c [2015] | |
300 | |a 1 Online-Ressource | ||
336 | |b txt | ||
337 | |b c | ||
338 | |b cr | ||
490 | 1 | |a Woodhead Publishing series in electronic and optical materials |v number 81 | |
520 | |a This book discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. Detailed chapters cover: temperature, moisture, and mechanical shock induced failure, adhesive interconnects, and viscoelasticity. -- |c Edited summary from book. | ||
700 | 1 | |a Mai, Y. W. |d 1946- | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781845695286 |
856 | 4 | 0 | |l TUM01 |p ZDB-10-ESC |q TUM_PDA_ESC |u https://app.knovel.com/hotlink/toc/id:kpRDMAAMS1/robust-design-of?kpromoter=marc |3 Volltext |
912 | |a ZDB-10-ESC | ||
912 | |a ZDB-10-ESC | ||
049 | |a DE-91 |
Datensatz im Suchindex
DE-BY-TUM_katkey | ZDB-10-ESC-ocn910159095 |
---|---|
_version_ | 1818779811020013568 |
adam_text | |
any_adam_object | |
author | Wong, E. -H |
author2 | Mai, Y. W. 1946- |
author2_role | |
author2_variant | y w m yw ywm |
author_facet | Wong, E. -H Mai, Y. W. 1946- |
author_role | |
author_sort | Wong, E. -H |
author_variant | e - w e- e-w |
building | Verbundindex |
bvnumber | localTUM |
collection | ZDB-10-ESC |
format | eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01520cam a2200337 i 4500</leader><controlfield tag="001">ZDB-10-ESC-ocn910159095</controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20241208213018.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr cnu|||unuuu</controlfield><controlfield tag="008">150527s2015 enk ob 001 0 eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBB552921</subfield><subfield code="2">bnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">017166313</subfield><subfield code="2">Uk</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0857099116</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1845695283</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780857099112</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781845695286</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781845695286</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wong, E. -H.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Robust design of microelectronics assemblies against mechanical shock, temperature and moisture</subfield><subfield code="c">E.-H. Wong and Y.-W. Mai</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge, UK</subfield><subfield code="b">Woodhead Publishing</subfield><subfield code="c">[2015]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Woodhead Publishing series in electronic and optical materials</subfield><subfield code="v">number 81</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This book discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. Detailed chapters cover: temperature, moisture, and mechanical shock induced failure, adhesive interconnects, and viscoelasticity. --</subfield><subfield code="c">Edited summary from book.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mai, Y. W.</subfield><subfield code="d">1946-</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781845695286</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">TUM01</subfield><subfield code="p">ZDB-10-ESC</subfield><subfield code="q">TUM_PDA_ESC</subfield><subfield code="u">https://app.knovel.com/hotlink/toc/id:kpRDMAAMS1/robust-design-of?kpromoter=marc</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-ESC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-ESC</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield></record></collection> |
id | ZDB-10-ESC-ocn910159095 |
illustrated | Not Illustrated |
indexdate | 2024-12-18T12:06:32Z |
institution | BVB |
isbn | 0857099116 1845695283 9780857099112 9781845695286 |
language | English |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource |
psigel | ZDB-10-ESC |
publishDate | 2015 |
publishDateSearch | 2015 |
publishDateSort | 2015 |
publisher | Woodhead Publishing |
record_format | marc |
series2 | Woodhead Publishing series in electronic and optical materials |
spelling | Wong, E. -H. Robust design of microelectronics assemblies against mechanical shock, temperature and moisture E.-H. Wong and Y.-W. Mai Cambridge, UK Woodhead Publishing [2015] 1 Online-Ressource txt c cr Woodhead Publishing series in electronic and optical materials number 81 This book discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. Detailed chapters cover: temperature, moisture, and mechanical shock induced failure, adhesive interconnects, and viscoelasticity. -- Edited summary from book. Mai, Y. W. 1946- Erscheint auch als Druck-Ausgabe 9781845695286 TUM01 ZDB-10-ESC TUM_PDA_ESC https://app.knovel.com/hotlink/toc/id:kpRDMAAMS1/robust-design-of?kpromoter=marc Volltext |
spellingShingle | Wong, E. -H Robust design of microelectronics assemblies against mechanical shock, temperature and moisture |
title | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture |
title_auth | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture |
title_exact_search | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture |
title_full | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture E.-H. Wong and Y.-W. Mai |
title_fullStr | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture E.-H. Wong and Y.-W. Mai |
title_full_unstemmed | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture E.-H. Wong and Y.-W. Mai |
title_short | Robust design of microelectronics assemblies against mechanical shock, temperature and moisture |
title_sort | robust design of microelectronics assemblies against mechanical shock temperature and moisture |
url | https://app.knovel.com/hotlink/toc/id:kpRDMAAMS1/robust-design-of?kpromoter=marc |
work_keys_str_mv | AT wongeh robustdesignofmicroelectronicsassembliesagainstmechanicalshocktemperatureandmoisture AT maiyw robustdesignofmicroelectronicsassembliesagainstmechanicalshocktemperatureandmoisture |