Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference

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Weitere Verfasser: Medvedevskikh, Sergey V. (HerausgeberIn), Sobina, Egor P. (HerausgeberIn), Kremleva, Olga N. (HerausgeberIn), Okrepilov, Mikhail V. (HerausgeberIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Cham Springer International Publishing 2022
Cham Springer
Ausgabe:1st ed. 2022
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LEADER 00000nmm a2200000zc 4500
001 BV048385133
003 DE-604
005 00000000000000.0
007 cr|uuu---uuuuu
008 220801s2022 |||| o||u| ||||||eng d
020 |a 9783031062858  |c Online  |9 978-3-031-06285-8 
024 7 |a 10.1007/978-3-031-06285-8  |2 doi 
035 |a (ZDB-2-PHA)9783031062858 
035 |a (OCoLC)1339059816 
035 |a (DE-599)BVBBV048385133 
040 |a DE-604  |b ger  |e rda 
041 0 |a eng 
049 |a DE-91  |a DE-19  |a DE-706  |a DE-522  |a DE-859  |a DE-703 
082 0 |a 530.7  |2 23 
082 0 |a 530.8  |2 23 
084 |a PHY 000  |2 stub 
245 1 0 |a Reference Materials in Measurement and Technology  |b Proceedings of the Fourth International Scientific Conference  |c edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov 
250 |a 1st ed. 2022 
264 1 |a Cham  |b Springer International Publishing  |c 2022 
264 1 |a Cham  |b Springer 
300 |a 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color) 
336 |b txt  |2 rdacontent 
337 |b c  |2 rdamedia 
338 |b cr  |2 rdacarrier 
650 4 |a Measurement Science and Instrumentation 
650 4 |a Materials Characterization Technique 
650 4 |a Materials Engineering 
650 4 |a Spectroscopy 
650 4 |a Measurement 
650 4 |a Measuring instruments 
650 4 |a Materials—Analysis 
650 4 |a Materials 
650 4 |a Spectrum analysis 
700 1 |a Medvedevskikh, Sergey V.  |4 edt 
700 1 |a Sobina, Egor P.  |4 edt 
700 1 |a Kremleva, Olga N.  |4 edt 
700 1 |a Okrepilov, Mikhail V.  |4 edt 
776 0 8 |i Erscheint auch als  |n Druck-Ausgabe  |z 978-3-031-06284-1 
776 0 8 |i Erscheint auch als  |n Druck-Ausgabe  |z 978-3-031-06286-5 
776 0 8 |i Erscheint auch als  |n Druck-Ausgabe  |z 978-3-031-06287-2 
856 4 0 |u https://doi.org/10.1007/978-3-031-06285-8  |x Verlag  |z URL des Erstveröffentlichers  |3 Volltext 
912 |a ZDB-2-PHA 
940 1 |q ZDB-2-PHA_2022 
999 |a oai:aleph.bib-bvb.de:BVB01-033763928 
966 e |u https://doi.org/10.1007/978-3-031-06285-8  |l BFB01  |p ZDB-2-PHA  |x Verlag  |3 Volltext 
966 e |u https://doi.org/10.1007/978-3-031-06285-8  |l FKE01  |p ZDB-2-PHA  |x Verlag  |3 Volltext 
966 e |u https://doi.org/10.1007/978-3-031-06285-8  |l TUM01  |p ZDB-2-PHA  |x Verlag  |3 Volltext 
966 e |u https://doi.org/10.1007/978-3-031-06285-8  |l UBM01  |p ZDB-2-PHA  |x Verlag  |3 Volltext 
966 e |u https://doi.org/10.1007/978-3-031-06285-8  |l UBT01  |p ZDB-2-PHA  |x Verlag  |3 Volltext 
966 e |u https://doi.org/10.1007/978-3-031-06285-8  |l UBY01  |p ZDB-2-PHA  |x Verlag  |3 Volltext 

Datensatz im Suchindex

DE-BY-TUM_katkey 2683821
DE-BY-TUM_local_url https://doi.org/10.1007/978-3-031-06285-8
Verlag
_version_ 1816714845802725376
adam_txt
any_adam_object
any_adam_object_boolean
author2 Medvedevskikh, Sergey V.
Sobina, Egor P.
Kremleva, Olga N.
Okrepilov, Mikhail V.
author2_role edt
edt
edt
edt
author2_variant s v m sv svm
e p s ep eps
o n k on onk
m v o mv mvo
author_facet Medvedevskikh, Sergey V.
Sobina, Egor P.
Kremleva, Olga N.
Okrepilov, Mikhail V.
building Verbundindex
bvnumber BV048385133
classification_tum PHY 000
collection ZDB-2-PHA
ctrlnum (ZDB-2-PHA)9783031062858
(OCoLC)1339059816
(DE-599)BVBBV048385133
dewey-full 530.7
530.8
dewey-hundreds 500 - Natural sciences and mathematics
dewey-ones 530 - Physics
dewey-raw 530.7
530.8
dewey-search 530.7
530.8
dewey-sort 3530.7
dewey-tens 530 - Physics
discipline Physik
discipline_str_mv Physik
doi_str_mv 10.1007/978-3-031-06285-8
edition 1st ed. 2022
format Electronic
eBook
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02594nmm a2200625zc 4500</leader><controlfield tag="001">BV048385133</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">220801s2022 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031062858</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-031-06285-8</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-031-06285-8</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-PHA)9783031062858</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1339059816</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048385133</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.7</subfield><subfield code="2">23</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.8</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reference Materials in Measurement and Technology</subfield><subfield code="b">Proceedings of the Fourth International Scientific Conference</subfield><subfield code="c">edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement Science and Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Characterization Technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measuring instruments</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials—Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Medvedevskikh, Sergey V.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sobina, Egor P.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kremleva, Olga N.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Okrepilov, Mikhail V.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-06284-1</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-06286-5</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-06287-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_2022</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-033763928</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">BFB01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id DE-604.BV048385133
illustrated Not Illustrated
index_date 2024-07-03T20:19:49Z
indexdate 2024-11-25T18:02:39Z
institution BVB
isbn 9783031062858
language English
oai_aleph_id oai:aleph.bib-bvb.de:BVB01-033763928
oclc_num 1339059816
open_access_boolean
owner DE-91
DE-BY-TUM
DE-19
DE-BY-UBM
DE-706
DE-522
DE-859
DE-703
owner_facet DE-91
DE-BY-TUM
DE-19
DE-BY-UBM
DE-706
DE-522
DE-859
DE-703
physical 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color)
psigel ZDB-2-PHA
ZDB-2-PHA_2022
publishDate 2022
publishDateSearch 2022
publishDateSort 2022
publisher Springer International Publishing
Springer
record_format marc
spellingShingle Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference
Measurement Science and Instrumentation
Materials Characterization Technique
Materials Engineering
Spectroscopy
Measurement
Measuring instruments
Materials—Analysis
Materials
Spectrum analysis
title Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference
title_auth Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference
title_exact_search Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference
title_exact_search_txtP Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference
title_full Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov
title_fullStr Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov
title_full_unstemmed Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov
title_short Reference Materials in Measurement and Technology
title_sort reference materials in measurement and technology proceedings of the fourth international scientific conference
title_sub Proceedings of the Fourth International Scientific Conference
topic Measurement Science and Instrumentation
Materials Characterization Technique
Materials Engineering
Spectroscopy
Measurement
Measuring instruments
Materials—Analysis
Materials
Spectrum analysis
topic_facet Measurement Science and Instrumentation
Materials Characterization Technique
Materials Engineering
Spectroscopy
Measurement
Measuring instruments
Materials—Analysis
Materials
Spectrum analysis
url https://doi.org/10.1007/978-3-031-06285-8
work_keys_str_mv AT medvedevskikhsergeyv referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference
AT sobinaegorp referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference
AT kremlevaolgan referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference
AT okrepilovmikhailv referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference