Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference
Gespeichert in:
Weitere Verfasser: | , , , |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Cham
Springer International Publishing
2022
Cham Springer |
Ausgabe: | 1st ed. 2022 |
Schlagworte: | |
Online-Zugang: | BFB01 FKE01 TUM01 UBM01 UBT01 UBY01 URL des Erstveröffentlichers |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV048385133 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 220801s2022 |||| o||u| ||||||eng d | ||
020 | |a 9783031062858 |c Online |9 978-3-031-06285-8 | ||
024 | 7 | |a 10.1007/978-3-031-06285-8 |2 doi | |
035 | |a (ZDB-2-PHA)9783031062858 | ||
035 | |a (OCoLC)1339059816 | ||
035 | |a (DE-599)BVBBV048385133 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-91 |a DE-19 |a DE-706 |a DE-522 |a DE-859 |a DE-703 | ||
082 | 0 | |a 530.7 |2 23 | |
082 | 0 | |a 530.8 |2 23 | |
084 | |a PHY 000 |2 stub | ||
245 | 1 | 0 | |a Reference Materials in Measurement and Technology |b Proceedings of the Fourth International Scientific Conference |c edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
250 | |a 1st ed. 2022 | ||
264 | 1 | |a Cham |b Springer International Publishing |c 2022 | |
264 | 1 | |a Cham |b Springer | |
300 | |a 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
650 | 4 | |a Measurement Science and Instrumentation | |
650 | 4 | |a Materials Characterization Technique | |
650 | 4 | |a Materials Engineering | |
650 | 4 | |a Spectroscopy | |
650 | 4 | |a Measurement | |
650 | 4 | |a Measuring instruments | |
650 | 4 | |a Materials—Analysis | |
650 | 4 | |a Materials | |
650 | 4 | |a Spectrum analysis | |
700 | 1 | |a Medvedevskikh, Sergey V. |4 edt | |
700 | 1 | |a Sobina, Egor P. |4 edt | |
700 | 1 | |a Kremleva, Olga N. |4 edt | |
700 | 1 | |a Okrepilov, Mikhail V. |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-06284-1 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-06286-5 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-06287-2 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-3-031-06285-8 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-PHA | ||
940 | 1 | |q ZDB-2-PHA_2022 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-033763928 | ||
966 | e | |u https://doi.org/10.1007/978-3-031-06285-8 |l BFB01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-031-06285-8 |l FKE01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-031-06285-8 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-031-06285-8 |l UBM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-031-06285-8 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-031-06285-8 |l UBY01 |p ZDB-2-PHA |x Verlag |3 Volltext |
Datensatz im Suchindex
DE-BY-TUM_katkey | 2683821 |
---|---|
DE-BY-TUM_local_url | https://doi.org/10.1007/978-3-031-06285-8 Verlag |
_version_ | 1816714845802725376 |
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author2 | Medvedevskikh, Sergey V. Sobina, Egor P. Kremleva, Olga N. Okrepilov, Mikhail V. |
author2_role | edt edt edt edt |
author2_variant | s v m sv svm e p s ep eps o n k on onk m v o mv mvo |
author_facet | Medvedevskikh, Sergey V. Sobina, Egor P. Kremleva, Olga N. Okrepilov, Mikhail V. |
building | Verbundindex |
bvnumber | BV048385133 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA |
ctrlnum | (ZDB-2-PHA)9783031062858 (OCoLC)1339059816 (DE-599)BVBBV048385133 |
dewey-full | 530.7 530.8 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 530 - Physics |
dewey-raw | 530.7 530.8 |
dewey-search | 530.7 530.8 |
dewey-sort | 3530.7 |
dewey-tens | 530 - Physics |
discipline | Physik |
discipline_str_mv | Physik |
doi_str_mv | 10.1007/978-3-031-06285-8 |
edition | 1st ed. 2022 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02594nmm a2200625zc 4500</leader><controlfield tag="001">BV048385133</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">220801s2022 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031062858</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-031-06285-8</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-031-06285-8</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-PHA)9783031062858</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1339059816</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048385133</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.7</subfield><subfield code="2">23</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.8</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reference Materials in Measurement and Technology</subfield><subfield code="b">Proceedings of the Fourth International Scientific Conference</subfield><subfield code="c">edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement Science and Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Characterization Technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measuring instruments</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials—Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Medvedevskikh, Sergey V.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sobina, Egor P.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kremleva, Olga N.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Okrepilov, Mikhail V.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-06284-1</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-06286-5</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-06287-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_2022</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-033763928</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">BFB01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-06285-8</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV048385133 |
illustrated | Not Illustrated |
index_date | 2024-07-03T20:19:49Z |
indexdate | 2024-11-25T18:02:39Z |
institution | BVB |
isbn | 9783031062858 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033763928 |
oclc_num | 1339059816 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-706 DE-522 DE-859 DE-703 |
owner_facet | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-706 DE-522 DE-859 DE-703 |
physical | 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color) |
psigel | ZDB-2-PHA ZDB-2-PHA_2022 |
publishDate | 2022 |
publishDateSearch | 2022 |
publishDateSort | 2022 |
publisher | Springer International Publishing Springer |
record_format | marc |
spellingShingle | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis |
title | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
title_auth | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
title_exact_search | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
title_exact_search_txtP | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
title_full | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
title_fullStr | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
title_full_unstemmed | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
title_short | Reference Materials in Measurement and Technology |
title_sort | reference materials in measurement and technology proceedings of the fourth international scientific conference |
title_sub | Proceedings of the Fourth International Scientific Conference |
topic | Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis |
topic_facet | Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis |
url | https://doi.org/10.1007/978-3-031-06285-8 |
work_keys_str_mv | AT medvedevskikhsergeyv referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference AT sobinaegorp referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference AT kremlevaolgan referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference AT okrepilovmikhailv referencematerialsinmeasurementandtechnologyproceedingsofthefourthinternationalscientificconference |