Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Springer Singapore
2022
Singapore Springer |
| Ausgabe: | 1st ed. 2022 |
| Schlagworte: | |
| Online-Zugang: | DE-634 DE-1043 DE-1046 DE-Aug4 DE-1050 DE-573 DE-M347 DE-92 DE-898 DE-859 DE-860 DE-861 DE-863 DE-862 DE-523 DE-91 DE-706 DE-29 URL des Erstveröffentlichers |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV047832998 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 220211s2022 xx o|||| 00||| eng d | ||
| 020 | |a 9789811661204 |c Online |9 978-981-1661-20-4 | ||
| 024 | 7 | |a 10.1007/978-981-16-6120-4 |2 doi | |
| 035 | |a (ZDB-2-ENG)9789811661204 | ||
| 035 | |a (OCoLC)1298750995 | ||
| 035 | |a (DE-599)BVBBV047832998 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-860 |a DE-91 |a DE-1046 |a DE-1043 |a DE-Aug4 |a DE-898 |a DE-861 |a DE-523 |a DE-859 |a DE-29 |a DE-863 |a DE-1050 |a DE-862 |a DE-92 |a DE-573 |a DE-M347 |a DE-706 |a DE-634 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 084 | |a MAS 000 |2 stub | ||
| 084 | |a ELT 000 |2 stub | ||
| 245 | 1 | 0 | |a Recent Advances in PMOS Negative Bias Temperature Instability |b Characterization and Modeling of Device Architecture, Material and Process Impact |c edited by Souvik Mahapatra |
| 250 | |a 1st ed. 2022 | ||
| 264 | 1 | |a Singapore |b Springer Singapore |c 2022 | |
| 264 | 1 | |a Singapore |b Springer | |
| 300 | |a 1 Online-Ressource (XXIII, 311 p. 213 illus., 189 illus. in color) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Electronic Circuits and Systems | |
| 650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
| 650 | 4 | |a Electronic Devices | |
| 650 | 4 | |a Electronic circuits | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Solid state physics | |
| 700 | 1 | |a Mahapatra, Souvik |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-1661-19-8 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-1661-21-1 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-1661-22-8 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-981-16-6120-4 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2022 | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-033216231 | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-634 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-1043 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-1046 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-Aug4 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-1050 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-573 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-M347 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-92 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-898 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-859 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-860 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-861 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-863 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-862 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-523 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-91 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-706 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-981-16-6120-4 |l DE-29 |p ZDB-2-ENG |x Verlag |3 Volltext | |
Datensatz im Suchindex
| DE-BY-TUM_katkey | 2611589 |
|---|---|
| _version_ | 1820897081861079040 |
| any_adam_object | |
| author2 | Mahapatra, Souvik |
| author2_role | edt |
| author2_variant | s m sm |
| author_facet | Mahapatra, Souvik |
| building | Verbundindex |
| bvnumber | BV047832998 |
| classification_tum | MAS 000 ELT 000 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)9789811661204 (OCoLC)1298750995 (DE-599)BVBBV047832998 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-981-16-6120-4 |
| edition | 1st ed. 2022 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03603nam a2200697zc 4500</leader><controlfield tag="001">BV047832998</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">220211s2022 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789811661204</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-1661-20-4</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-981-16-6120-4</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9789811661204</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1298750995</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047832998</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Recent Advances in PMOS Negative Bias Temperature Instability</subfield><subfield code="b">Characterization and Modeling of Device Architecture, Material and Process Impact</subfield><subfield code="c">edited by Souvik Mahapatra</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer Singapore</subfield><subfield code="c">2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XXIII, 311 p. 213 illus., 189 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid state physics</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mahapatra, Souvik</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-1661-19-8</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-1661-21-1</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-1661-22-8</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2022</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-033216231</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-1050</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-573</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-M347</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-92</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-860</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-861</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-863</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-862</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-523</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-16-6120-4</subfield><subfield code="l">DE-29</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV047832998 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T09:10:11Z |
| institution | BVB |
| isbn | 9789811661204 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033216231 |
| oclc_num | 1298750995 |
| open_access_boolean | |
| owner | DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-29 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
| owner_facet | DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-29 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
| physical | 1 Online-Ressource (XXIII, 311 p. 213 illus., 189 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2022 |
| publishDate | 2022 |
| publishDateSearch | 2022 |
| publishDateSort | 2022 |
| publisher | Springer Singapore Springer |
| record_format | marc |
| spellingShingle | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices Electronic circuits Electronics Solid state physics |
| title | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_auth | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_exact_search | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_full | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact edited by Souvik Mahapatra |
| title_fullStr | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact edited by Souvik Mahapatra |
| title_full_unstemmed | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact edited by Souvik Mahapatra |
| title_short | Recent Advances in PMOS Negative Bias Temperature Instability |
| title_sort | recent advances in pmos negative bias temperature instability characterization and modeling of device architecture material and process impact |
| title_sub | Characterization and Modeling of Device Architecture, Material and Process Impact |
| topic | Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices Electronic circuits Electronics Solid state physics |
| topic_facet | Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices Electronic circuits Electronics Solid state physics |
| url | https://doi.org/10.1007/978-981-16-6120-4 |
| work_keys_str_mv | AT mahapatrasouvik recentadvancesinpmosnegativebiastemperatureinstabilitycharacterizationandmodelingofdevicearchitecturematerialandprocessimpact |