Noise in Nanoscale Semiconductor Devices
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| Format: | Elektronisch E-Book |
| Sprache: | English |
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Springer International Publishing
2020
Cham Springer |
| Ausgabe: | 1st ed. 2020 |
| Schlagworte: | |
| Online-Zugang: | DE-634 DE-1043 DE-1046 DE-Aug4 DE-1050 DE-573 DE-M347 DE-92 DE-898 DE-859 DE-860 DE-861 DE-863 DE-862 DE-523 DE-91 DE-706 URL des Erstveröffentlichers Buchcover |
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| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV046706025 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 200506s2020 xx o|||| 00||| eng d | ||
| 020 | |a 9783030375003 |c Online |9 978-3-030-37500-3 | ||
| 024 | 7 | |a 10.1007/978-3-030-37500-3 |2 doi | |
| 035 | |a (ZDB-2-ENG)9783030375003 | ||
| 035 | |a (OCoLC)1199709782 | ||
| 035 | |a (DE-599)BVBBV046706025 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-860 |a DE-91 |a DE-1046 |a DE-1043 |a DE-Aug4 |a DE-898 |a DE-861 |a DE-523 |a DE-859 |a DE-863 |a DE-1050 |a DE-862 |a DE-92 |a DE-573 |a DE-M347 |a DE-706 |a DE-634 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 084 | |a ZN 4035 |0 (DE-625)157342: |2 rvk | ||
| 084 | |a ELT 000 |2 stub | ||
| 084 | |a MAS 000 |2 stub | ||
| 245 | 1 | 0 | |a Noise in Nanoscale Semiconductor Devices |c edited by Tibor Grasser |
| 250 | |a 1st ed. 2020 | ||
| 264 | 1 | |a Cham |b Springer International Publishing |c 2020 | |
| 264 | 1 | |a Cham |b Springer | |
| 300 | |a 1 Online-Ressource (VI, 729 p. 550 illus., 443 illus. in color) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Electronic Circuits and Devices | |
| 650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
| 650 | 4 | |a Electronic circuits | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Microelectronics | |
| 650 | 0 | 7 | |a RAM |0 (DE-588)4176909-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a MOS-FET |0 (DE-588)4207266-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Nanometerbereich |0 (DE-588)4327473-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronisches Rauschen |0 (DE-588)4151926-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Statisches RAM |0 (DE-588)4381052-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronisches Rauschen |0 (DE-588)4151926-7 |D s |
| 689 | 0 | 1 | |a Nanometerbereich |0 (DE-588)4327473-0 |D s |
| 689 | 0 | 2 | |a MOS-FET |0 (DE-588)4207266-9 |D s |
| 689 | 0 | 3 | |a RAM |0 (DE-588)4176909-0 |D s |
| 689 | 0 | 4 | |a Statisches RAM |0 (DE-588)4381052-4 |D s |
| 689 | 0 | 5 | |a CMOS |0 (DE-588)4010319-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Grasser, Tibor |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-37499-0 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-37501-0 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-37502-7 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-030-37500-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 856 | 4 | 2 | |m SWB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032116487&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Buchcover |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2020_Fremddaten | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-032116487 | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-634 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-1043 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-1046 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-Aug4 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-1050 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-573 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-M347 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-92 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-898 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-859 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-860 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-861 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-863 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-862 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-523 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-91 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-37500-3 |l DE-706 |p ZDB-2-ENG |x Verlag |3 Volltext | |
Datensatz im Suchindex
| DE-BY-TUM_katkey | 2471880 |
|---|---|
| _version_ | 1820895300969037824 |
| any_adam_object | 1 |
| author2 | Grasser, Tibor |
| author2_role | edt |
| author2_variant | t g tg |
| author_facet | Grasser, Tibor |
| building | Verbundindex |
| bvnumber | BV046706025 |
| classification_rvk | ZN 4035 |
| classification_tum | ELT 000 MAS 000 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)9783030375003 (OCoLC)1199709782 (DE-599)BVBBV046706025 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-030-37500-3 |
| edition | 1st ed. 2020 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04383nam a2200865zc 4500</leader><controlfield tag="001">BV046706025</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">200506s2020 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030375003</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-030-37500-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-030-37500-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783030375003</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1199709782</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046706025</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4035</subfield><subfield code="0">(DE-625)157342:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Noise in Nanoscale Semiconductor Devices</subfield><subfield code="c">edited by Tibor Grasser</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (VI, 729 p. 550 illus., 443 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">RAM</subfield><subfield code="0">(DE-588)4176909-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanometerbereich</subfield><subfield code="0">(DE-588)4327473-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Rauschen</subfield><subfield code="0">(DE-588)4151926-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Statisches RAM</subfield><subfield code="0">(DE-588)4381052-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Rauschen</subfield><subfield code="0">(DE-588)4151926-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Nanometerbereich</subfield><subfield code="0">(DE-588)4327473-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">RAM</subfield><subfield code="0">(DE-588)4176909-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Statisches RAM</subfield><subfield code="0">(DE-588)4381052-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="5"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Grasser, Tibor</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-37499-0</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-37501-0</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-37502-7</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">SWB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032116487&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Buchcover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2020_Fremddaten</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032116487</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-1050</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-573</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-M347</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-92</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-860</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-861</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-863</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-862</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-523</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-37500-3</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV046706025 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T08:12:11Z |
| institution | BVB |
| isbn | 9783030375003 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032116487 |
| oclc_num | 1199709782 |
| open_access_boolean | |
| owner | DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
| owner_facet | DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
| physical | 1 Online-Ressource (VI, 729 p. 550 illus., 443 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2020_Fremddaten |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| spellingShingle | Noise in Nanoscale Semiconductor Devices Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics RAM (DE-588)4176909-0 gnd MOS-FET (DE-588)4207266-9 gnd CMOS (DE-588)4010319-5 gnd Nanometerbereich (DE-588)4327473-0 gnd Elektronisches Rauschen (DE-588)4151926-7 gnd Statisches RAM (DE-588)4381052-4 gnd |
| subject_GND | (DE-588)4176909-0 (DE-588)4207266-9 (DE-588)4010319-5 (DE-588)4327473-0 (DE-588)4151926-7 (DE-588)4381052-4 |
| title | Noise in Nanoscale Semiconductor Devices |
| title_auth | Noise in Nanoscale Semiconductor Devices |
| title_exact_search | Noise in Nanoscale Semiconductor Devices |
| title_full | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser |
| title_fullStr | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser |
| title_full_unstemmed | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser |
| title_short | Noise in Nanoscale Semiconductor Devices |
| title_sort | noise in nanoscale semiconductor devices |
| topic | Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics RAM (DE-588)4176909-0 gnd MOS-FET (DE-588)4207266-9 gnd CMOS (DE-588)4010319-5 gnd Nanometerbereich (DE-588)4327473-0 gnd Elektronisches Rauschen (DE-588)4151926-7 gnd Statisches RAM (DE-588)4381052-4 gnd |
| topic_facet | Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics RAM MOS-FET CMOS Nanometerbereich Elektronisches Rauschen Statisches RAM |
| url | https://doi.org/10.1007/978-3-030-37500-3 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032116487&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT grassertibor noiseinnanoscalesemiconductordevices |