WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bombay
Indian Institute of Technology
2015
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV045950487 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 190625s2015 a||| |||| 10||| eng d | ||
| 035 | |a (OCoLC)1107327718 | ||
| 035 | |a (DE-599)BVBBV045950487 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-739 | ||
| 245 | 1 | 0 | |a WRTLT 2015 |b VMCC ; Indian Insitute of Technology Bombay - Mumbai, India |c [program committee: Ilia Polian ... ; 16th IEEE Workshop on RTL and High Level Testing - 2015] |
| 264 | 1 | |a Bombay |b Indian Institute of Technology |c 2015 | |
| 300 | |a 90 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Erprobung |0 (DE-588)4260322-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Erprobung |0 (DE-588)4260322-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Polian, Ilia |e Sonstige |0 (DE-588)1047025671 |4 oth | |
| 710 | 2 | |a Workshop on RTL and High Level Testing |n 16 |d 2015 |c Mumbai, India |e Sonstige |4 oth | |
| 710 | 2 | |a Indian Institute of Technology |c Bombay |e Sonstige |4 oth | |
| 856 | 4 | 2 | |m Digitalisierung UB Passau - ADAM Catalogue Enrichment |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031332581&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031332581 | ||
Datensatz im Suchindex
| _version_ | 1804180159526338560 |
|---|---|
| adam_text | Table of Contents Analysis of SRAM-Based FPGA SEU Sensitivity to EMI and TID: the need for combined tests........................¿. Juliano Benfica, Bruno Green, Leticia Bolzani Poehls, Fabian Var gas, Nilberto Medina, Nemitala Added, Vítor de Aguiar, Eduardo Mac chione, Marciiéi Da Silva, Martin Perez, Miguel Sofo Haro, Ivan Sidelnik, Jerónimo Biostein, Jose Lipovetzky and Eduardo Bezerra Mapping analysis between RTL/high-level and gate-level designs with inductive invariants on partial behaviors .......... ............. ............ ... Masahiro Fujita, Qinhao Wang and Yusuke Kimura A Framework for Verification of Hard Tied Signals of SoC................. Prokash Ghosh, Sandip Ghosh and Raghavendra Srinivas Test Circuit for Electrical Interconnect Tests of 3D ICs without Boundary Scan Flip Flops.............. ................... ......................... ............... Masaki Hashizume, Shoichi Umezu, Yuki Ikiri, Hiroyuki Yotsuyanagi and Shyue-Kung Lu A Prototype of a Hardware SAT Solver for Similar Large Instances and Its Application to Test Generation .................................................................. Tsuyoshi Iwagaki, Shoichi Ohmoto, Hideyuki Ichihara and Tomoo Inoue Power Aware 3-D IC Testing using Genetic Algorithm ................. Tanusree Kaibartta and Debesh Das A Field-Test Architecture for Circuits Configured on FPGAs ........... Sho Kano and Satoshi Ohtake Improved Synthesis of Reversible Logic Circuits..................................... Bikromadittya Mondai, Pradyut Sarkar and Susanta Chakraborty Model Checking based verification of
Hardware Trustworthiness.............. Yingxin Qiu and Huawei Li BDD based PDF Testable Combinational Circuit Design............................ Toral Shah, Virendra Singh and Anzhela Matrosova A Circular BIST Architecture Using Internal Responses of Circuits for Reseeding and Extra Observation ............. .................... ....... Chung-Min Shiao, Wei- Cheng Lien and Kuen- Jong Lee Effect of Static Stress in Burn-in Environment on Yield of Complex Designs ............................................ ............. .................................. .. Ankush Srivastava, Amit Aggarwal and Rakesh Bakhshi
Note on Dependable Logic Design by Ambipolar Device and Its Fault Modeling.......... ............................................. .................................................... Dan Takahashi and Masayuki Arai A Fault Diagnosis Method for a Single Universal Logical Fault Model Using Multi Cycle Capture Test Sets ................... .............. ......................... Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa and Koji Yamazaki Diagnosis Pattern Generation to Distinguish Inter-Gate and Intra-Gate Faults in CMOS Logic Circuits .............................................. ........... ............. Cheng-Hung Wu, Kuen-Jong Lee and Sheng-Tze Wang A Sequence Generation Method to detect Hardware Trojan Circuits........ Masayoshi Yoshimura, Tomohiro Bouyashiki and Toshinori Hosokawa 69 ^ 80 84
|
| any_adam_object | 1 |
| author_GND | (DE-588)1047025671 |
| building | Verbundindex |
| bvnumber | BV045950487 |
| ctrlnum | (OCoLC)1107327718 (DE-599)BVBBV045950487 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01560nam a2200349 c 4500</leader><controlfield tag="001">BV045950487</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">190625s2015 a||| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1107327718</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045950487</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">WRTLT 2015</subfield><subfield code="b">VMCC ; Indian Insitute of Technology Bombay - Mumbai, India</subfield><subfield code="c">[program committee: Ilia Polian ... ; 16th IEEE Workshop on RTL and High Level Testing - 2015]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bombay</subfield><subfield code="b">Indian Institute of Technology</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">90 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Erprobung</subfield><subfield code="0">(DE-588)4260322-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Erprobung</subfield><subfield code="0">(DE-588)4260322-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Polian, Ilia</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1047025671</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Workshop on RTL and High Level Testing</subfield><subfield code="n">16</subfield><subfield code="d">2015</subfield><subfield code="c">Mumbai, India</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Indian Institute of Technology</subfield><subfield code="c">Bombay</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Passau - ADAM Catalogue Enrichment</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031332581&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031332581</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV045950487 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:31:20Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031332581 |
| oclc_num | 1107327718 |
| open_access_boolean | |
| owner | DE-739 |
| owner_facet | DE-739 |
| physical | 90 Seiten Illustrationen, Diagramme |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Indian Institute of Technology |
| record_format | marc |
| spelling | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India [program committee: Ilia Polian ... ; 16th IEEE Workshop on RTL and High Level Testing - 2015] Bombay Indian Institute of Technology 2015 90 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier VLSI (DE-588)4117388-0 gnd rswk-swf Erprobung (DE-588)4260322-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content VLSI (DE-588)4117388-0 s Erprobung (DE-588)4260322-5 s DE-604 Polian, Ilia Sonstige (DE-588)1047025671 oth Workshop on RTL and High Level Testing 16 2015 Mumbai, India Sonstige oth Indian Institute of Technology Bombay Sonstige oth Digitalisierung UB Passau - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031332581&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India VLSI (DE-588)4117388-0 gnd Erprobung (DE-588)4260322-5 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4260322-5 (DE-588)1071861417 |
| title | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India |
| title_auth | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India |
| title_exact_search | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India |
| title_full | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India [program committee: Ilia Polian ... ; 16th IEEE Workshop on RTL and High Level Testing - 2015] |
| title_fullStr | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India [program committee: Ilia Polian ... ; 16th IEEE Workshop on RTL and High Level Testing - 2015] |
| title_full_unstemmed | WRTLT 2015 VMCC ; Indian Insitute of Technology Bombay - Mumbai, India [program committee: Ilia Polian ... ; 16th IEEE Workshop on RTL and High Level Testing - 2015] |
| title_short | WRTLT 2015 |
| title_sort | wrtlt 2015 vmcc indian insitute of technology bombay mumbai india |
| title_sub | VMCC ; Indian Insitute of Technology Bombay - Mumbai, India |
| topic | VLSI (DE-588)4117388-0 gnd Erprobung (DE-588)4260322-5 gnd |
| topic_facet | VLSI Erprobung Konferenzschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031332581&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT polianilia wrtlt2015vmccindianinsituteoftechnologybombaymumbaiindia AT workshoponrtlandhighleveltesting wrtlt2015vmccindianinsituteoftechnologybombaymumbaiindia AT indianinstituteoftechnology wrtlt2015vmccindianinsituteoftechnologybombaymumbaiindia |