ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2007
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| 246 | 1 | 3 | |a Proceedings of the 33rd International Symposium for Testing and Failure Analysis |
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Datensatz im Suchindex
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| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 2007, San Jose, Calif.> Verfasser aut ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2007 1 online resource (xvi, 356 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses 1\p (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth 0871708639 9780871708632 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis |
| title_alt | Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis |
| title_exact_search | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis |
| title_full | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_fullStr | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_full_unstemmed | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_short | ISTFA 2007 |
| title_sort | istfa 2007 proceedings of the 33rd international symposium for testing and failure analysis november 4 8 2007 san jose mcenery convention center san jose california usa thirty third international symposium for testing and failure analysis |
| title_sub | proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA = Thirty-third International Symposium for Testing and Failure Analysis |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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