A one-semester course in modeling of VLSI interconnections
Quantitative understanding of the parasitic capacitances and inductances and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-of...
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, [New York] (222 East 46th Street, New York, NY 10017)
Momentum Press
2015
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| Schriftenreihe: | Electronic circuits and semiconductor devices collection
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| Schlagworte: | |
| Online-Zugang: | DE-863 DE-862 |
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