Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Compute...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Michael, Christopher (VerfasserIn), Ismail, Mohammed (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Boston, MA Springer US 1993
Schriftenreihe:	The Kluwer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing 211
Schlagworte:	Computer Science Computer-Aided Engineering (CAD, CAE) and Design Electrical Engineering Computer science Computer-aided engineering Electrical engineering Entwurf VLSI Statistisches Modell MOS-Schaltung
Online-Zugang:	BTU01 URL des Erstveröffentlichers
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!