Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book the...
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| Hauptverfasser: | , |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1995
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| Schriftenreihe: | The Springer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing
312 |
| Schlagworte: | |
| Online-Zugang: | DE-634 URL des Erstveröffentlichers |
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Analog signal generation for built in self test of mixed signal integrated circuits
Veröffentlicht 1995
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