Particle Characterization: Light Scattering Methods
Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of mo...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Dordrecht
Springer Netherlands
2002
|
| Schriftenreihe: | Particle Technology Series
13 |
| Schlagworte: | |
| Online-Zugang: | DE-703 URL des Erstveröffentlichers |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045151698 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180828s2002 xx o|||| 00||| eng d | ||
| 020 | |a 9780306471247 |9 978-0-306-47124-7 | ||
| 024 | 7 | |a 10.1007/0-306-47124-8 |2 doi | |
| 035 | |a (ZDB-2-CMS)978-0-306-47124-7 | ||
| 035 | |a (OCoLC)1050937905 | ||
| 035 | |a (DE-599)BVBBV045151698 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 082 | 0 | |a 541 |2 23 | |
| 084 | |a VN 7170 |0 (DE-625)147607:253 |2 rvk | ||
| 100 | 1 | |a Xu, Renliang |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Particle Characterization: Light Scattering Methods |c by Renliang Xu ; edited by Brian Scarlett |
| 264 | 1 | |a Dordrecht |b Springer Netherlands |c 2002 | |
| 300 | |a 1 Online-Ressource (XVII, 399 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Particle Technology Series |v 13 | |
| 520 | |a Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields | ||
| 650 | 4 | |a Chemistry | |
| 650 | 4 | |a Physical Chemistry | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Measurement Science and Instrumentation | |
| 650 | 4 | |a Analytical Chemistry | |
| 650 | 4 | |a Chemistry | |
| 650 | 4 | |a Analytical chemistry | |
| 650 | 4 | |a Physical chemistry | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Materials science | |
| 650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Teilchenmesstechnik |0 (DE-588)4129617-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Teilchenmesstechnik |0 (DE-588)4129617-5 |D s |
| 689 | 0 | 1 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Scarlett, Brian |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9780792363002 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/0-306-47124-8 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-CMS | ||
| 940 | 1 | |q ZDB-2-CMS_2000/2004 | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-030541366 | |
| 966 | e | |u https://doi.org/10.1007/0-306-47124-8 |l DE-703 |p ZDB-2-CMS |q ZDB-2-CMS_2000/2004 |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1819303530756833281 |
|---|---|
| any_adam_object | |
| author | Xu, Renliang |
| author2 | Scarlett, Brian |
| author2_role | edt |
| author2_variant | b s bs |
| author_facet | Xu, Renliang Scarlett, Brian |
| author_role | aut |
| author_sort | Xu, Renliang |
| author_variant | r x rx |
| building | Verbundindex |
| bvnumber | BV045151698 |
| classification_rvk | VN 7170 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)978-0-306-47124-7 (OCoLC)1050937905 (DE-599)BVBBV045151698 |
| dewey-full | 541 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 541 - Physical chemistry |
| dewey-raw | 541 |
| dewey-search | 541 |
| dewey-sort | 3541 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| doi_str_mv | 10.1007/0-306-47124-8 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03393nam a2200601zcb4500</leader><controlfield tag="001">BV045151698</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180828s2002 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780306471247</subfield><subfield code="9">978-0-306-47124-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/0-306-47124-8</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-CMS)978-0-306-47124-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1050937905</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045151698</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">541</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VN 7170</subfield><subfield code="0">(DE-625)147607:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Xu, Renliang</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Particle Characterization: Light Scattering Methods</subfield><subfield code="c">by Renliang Xu ; edited by Brian Scarlett</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Dordrecht</subfield><subfield code="b">Springer Netherlands</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XVII, 399 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Particle Technology Series</subfield><subfield code="v">13</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement Science and Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Teilchenmesstechnik</subfield><subfield code="0">(DE-588)4129617-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Teilchenmesstechnik</subfield><subfield code="0">(DE-588)4129617-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Scarlett, Brian</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9780792363002</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/0-306-47124-8</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-CMS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-CMS_2000/2004</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030541366</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/0-306-47124-8</subfield><subfield code="l">DE-703</subfield><subfield code="p">ZDB-2-CMS</subfield><subfield code="q">ZDB-2-CMS_2000/2004</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045151698 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-24T06:50:49Z |
| institution | BVB |
| isbn | 9780306471247 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030541366 |
| oclc_num | 1050937905 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | 1 Online-Ressource (XVII, 399 p) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2000/2004 ZDB-2-CMS ZDB-2-CMS_2000/2004 |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Springer Netherlands |
| record_format | marc |
| series2 | Particle Technology Series |
| spelling | Xu, Renliang Verfasser aut Particle Characterization: Light Scattering Methods by Renliang Xu ; edited by Brian Scarlett Dordrecht Springer Netherlands 2002 1 Online-Ressource (XVII, 399 p) txt rdacontent c rdamedia cr rdacarrier Particle Technology Series 13 Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields Chemistry Physical Chemistry Characterization and Evaluation of Materials Measurement Science and Instrumentation Analytical Chemistry Analytical chemistry Physical chemistry Physical measurements Measurement Materials science Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Teilchenmesstechnik (DE-588)4129617-5 gnd rswk-swf Teilchenmesstechnik (DE-588)4129617-5 s Optische Messtechnik (DE-588)4172667-4 s 1\p DE-604 Scarlett, Brian edt Erscheint auch als Druck-Ausgabe 9780792363002 https://doi.org/10.1007/0-306-47124-8 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Xu, Renliang Particle Characterization: Light Scattering Methods Chemistry Physical Chemistry Characterization and Evaluation of Materials Measurement Science and Instrumentation Analytical Chemistry Analytical chemistry Physical chemistry Physical measurements Measurement Materials science Optische Messtechnik (DE-588)4172667-4 gnd Teilchenmesstechnik (DE-588)4129617-5 gnd |
| subject_GND | (DE-588)4172667-4 (DE-588)4129617-5 |
| title | Particle Characterization: Light Scattering Methods |
| title_auth | Particle Characterization: Light Scattering Methods |
| title_exact_search | Particle Characterization: Light Scattering Methods |
| title_full | Particle Characterization: Light Scattering Methods by Renliang Xu ; edited by Brian Scarlett |
| title_fullStr | Particle Characterization: Light Scattering Methods by Renliang Xu ; edited by Brian Scarlett |
| title_full_unstemmed | Particle Characterization: Light Scattering Methods by Renliang Xu ; edited by Brian Scarlett |
| title_short | Particle Characterization: Light Scattering Methods |
| title_sort | particle characterization light scattering methods |
| topic | Chemistry Physical Chemistry Characterization and Evaluation of Materials Measurement Science and Instrumentation Analytical Chemistry Analytical chemistry Physical chemistry Physical measurements Measurement Materials science Optische Messtechnik (DE-588)4172667-4 gnd Teilchenmesstechnik (DE-588)4129617-5 gnd |
| topic_facet | Chemistry Physical Chemistry Characterization and Evaluation of Materials Measurement Science and Instrumentation Analytical Chemistry Analytical chemistry Physical chemistry Physical measurements Measurement Materials science Optische Messtechnik Teilchenmesstechnik |
| url | https://doi.org/10.1007/0-306-47124-8 |
| work_keys_str_mv | AT xurenliang particlecharacterizationlightscatteringmethods AT scarlettbrian particlecharacterizationlightscatteringmethods |