High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and te...

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Bibliographische Detailangaben

1. Verfasser:	Adams, R. Dean (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Boston, MA Springer US 2003
Schriftenreihe:	Frontiers in Electronic Testing 22A
Schlagworte:	Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits
Online-Zugang:	DE-573 DE-634 URL des Erstveröffentlichers
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